• DocumentCode
    1301985
  • Title

    Specific Contact Resistivity of Tunnel Barrier Contacts Used for Fermi Level Depinning

  • Author

    Roy, Arunanshu M. ; Lin, J.-Y.Jason ; Saraswat, Krishna C.

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
  • Volume
    31
  • Issue
    10
  • fYear
    2010
  • Firstpage
    1077
  • Lastpage
    1079
  • Abstract
    Recent experiments have demonstrated the possibility of reducing the effect of Fermi level pinning by using a thin dielectric tunneling barrier. For contacts to n-Ge where the Fermi level of metals pins near the valence band, alleviation of Fermi pinning has the potential to reduce the specific contact resistivity since the Schottky barrier is reduced. However, using a tunnel barrier to alleviate Fermi pinning also leads to the addition of tunneling resistance at the contact. This letter studies theoretically the effect of this added tunneling resistance on the overall specific contact resistivity. Different dielectric materials are studied in order to understand the feasibility and limitations of this technique in making good ohmic contacts to n-type Ge.
  • Keywords
    Fermi level; Schottky barriers; contact resistance; dielectric materials; germanium; ohmic contacts; Fermi level depinning; Ge; Schottky barrier; dielectric material; n-type Ge; ohmic contact; specific contact resistivity; thin dielectric tunneling barrier; tunnel barrier contact; tunneling resistance; Conductivity; Dielectrics; Insulators; Metals; Resistance; Schottky barriers; Tunneling; Fermi depinning; Schottky barrier; specific contact resistivity; tunneling barrier;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2010.2058838
  • Filename
    5555935