Angular memory and frequency interferometry for mean height profiling of a rough surface

The polarimetric angular memory effect is applied to obtain the average topographic height of a rough surface. This novel effect improves the height sensitivity while maintaining a good degree of correlation between the sensors. By using a reference flat surface, the interferometric phase is linearly related to the mean topographic height. The combination of angular memory and wideband frequency interferometry (AMFI) is realized and offers a means to design a robust interferometric system. Extension of the technique to the pulse scattering problem is studied through the two-frequency mutual coherence function, and its time-domain transform provides an equivalent way to obtain the mean topographic height by combining both spatial and temporal diversity. Millimeter-wave (MMW) experiments are conducted with rough surfaces of different statistics and scattering media of different types (gravel, sand, and rough surfaces) to prove the effectiveness of the technique