An Analytical Model of the Propagation Induced Pulse Broadening (PIPB) Effects on Single Event Transient in Flash-Based FPGAs

A methodology for characterization of Propagation Induced Pulse Broadening (PIPB) effects concerning the Single Event Transients (SETs) propagation within logic and routing resources of Flash-based Field Programmable Gate Arrays (FPGAs) is presented. Electrical-based fault injection was performed on the FPGA board and at the electrical model. Experimental results matched the electrical simulations, which validate the effectiveness of the method.