DocumentCode
1302184
Title
An Analytical Model of the Propagation Induced Pulse Broadening (PIPB) Effects on Single Event Transient in Flash-Based FPGAs
Author
Sterpone, L. ; Battezzati, N. ; Kastensmidt, F. Lima ; Chipana, R.
Author_Institution
Dipt. di Autom. e Inf., Politec. di Torino, Torino, Italy
Volume
58
Issue
5
fYear
2011
Firstpage
2333
Lastpage
2340
Abstract
A methodology for characterization of Propagation Induced Pulse Broadening (PIPB) effects concerning the Single Event Transients (SETs) propagation within logic and routing resources of Flash-based Field Programmable Gate Arrays (FPGAs) is presented. Electrical-based fault injection was performed on the FPGA board and at the electrical model. Experimental results matched the electrical simulations, which validate the effectiveness of the method.
Keywords
field programmable gate arrays; flash memories; network routing; electrical-based fault injection; field programmable gate arrays; flash-based FPGA; logic resources; propagation induced pulse broadening effects; routing resources; single event transient; single event transients; Analytical models; Field programmable gate arrays; Logic gates; Routing; Switches; Transient analysis; Transistors; Characterization; flash-based FPGAs; single event transients (SETs);
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2011.2161886
Filename
5991970
Link To Document