DocumentCode
1302204
Title
Variable-Latency Adder (VL-Adder) Designs for Low Power and NBTI Tolerance
Author
Chen, Yiran ; Li, Hai ; Koh, Cheng-Kok ; Sun, Guangyu ; Li, Jing ; Xie, Yuan ; Roy, Kaushik
Author_Institution
Seagate Technol., Bloomington, MN, USA
Volume
18
Issue
11
fYear
2010
Firstpage
1621
Lastpage
1624
Abstract
In this paper, we proposed a new adder design called variable-latency adder (VL-adder). This technique allows the adder to work at a lower supply voltage than that required by a conventional adder while maintaining the same throughput. The VL-adder design can be further modified to overcome the effects of negative bias temperature instability (NBTI) on circuit delay. By applying VL-adder concept to a 64-bit carry-select adder design, more than 40% energy saving is obtained when a similar throughput is maintained.
Keywords
adders; digital arithmetic; integrated circuit design; logic design; IC design; NBTI tolerance; circuit delay; digital arithmetic; logic design; negative bias temperature instability; variable-latency adder designs; word length 64 bit; Adders; Circuits; Clocks; Delay; Negative bias temperature instability; Niobium compounds; Sun; Throughput; Titanium compounds; Very large scale integration; Digital arithmetic; IC design; logic design;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2009.2026280
Filename
5208444
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