• DocumentCode
    1302204
  • Title

    Variable-Latency Adder (VL-Adder) Designs for Low Power and NBTI Tolerance

  • Author

    Chen, Yiran ; Li, Hai ; Koh, Cheng-Kok ; Sun, Guangyu ; Li, Jing ; Xie, Yuan ; Roy, Kaushik

  • Author_Institution
    Seagate Technol., Bloomington, MN, USA
  • Volume
    18
  • Issue
    11
  • fYear
    2010
  • Firstpage
    1621
  • Lastpage
    1624
  • Abstract
    In this paper, we proposed a new adder design called variable-latency adder (VL-adder). This technique allows the adder to work at a lower supply voltage than that required by a conventional adder while maintaining the same throughput. The VL-adder design can be further modified to overcome the effects of negative bias temperature instability (NBTI) on circuit delay. By applying VL-adder concept to a 64-bit carry-select adder design, more than 40% energy saving is obtained when a similar throughput is maintained.
  • Keywords
    adders; digital arithmetic; integrated circuit design; logic design; IC design; NBTI tolerance; circuit delay; digital arithmetic; logic design; negative bias temperature instability; variable-latency adder designs; word length 64 bit; Adders; Circuits; Clocks; Delay; Negative bias temperature instability; Niobium compounds; Sun; Throughput; Titanium compounds; Very large scale integration; Digital arithmetic; IC design; logic design;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2009.2026280
  • Filename
    5208444