Title :
A functional testing method for microprocessors
Author :
Shen, Li ; Su, Stephen Y H
Author_Institution :
State Univ. of New York, Binghamton, NY, USA
fDate :
10/1/1988 12:00:00 AM
Abstract :
A method is presented for functional testing of microprocessors. First, a control fault model at the RTL (register transfer language) level is developed. Based on this model, the authors establish testing requirements for control faults. They present two test procedures to verify the write and read sequences, and use the write and read sequences to test each instruction in the microprocessor. By utilizing k-out-of-m codes, they use fewer tests to cover more faults, thereby reducing the test generation time
Keywords :
computer testing; microprocessor chips; control fault model; functional testing method; k-out-of-m codes; microprocessors; register transfer language; test generation time; testing requirements; Circuit faults; Circuit testing; Decoding; Fault tolerance; Integrated circuit technology; Kernel; Microprocessors; Registers; Sequential analysis; Very large scale integration;
Journal_Title :
Computers, IEEE Transactions on
