DocumentCode
1302257
Title
A functional testing method for microprocessors
Author
Shen, Li ; Su, Stephen Y H
Author_Institution
State Univ. of New York, Binghamton, NY, USA
Volume
37
Issue
10
fYear
1988
fDate
10/1/1988 12:00:00 AM
Firstpage
1288
Lastpage
1293
Abstract
A method is presented for functional testing of microprocessors. First, a control fault model at the RTL (register transfer language) level is developed. Based on this model, the authors establish testing requirements for control faults. They present two test procedures to verify the write and read sequences, and use the write and read sequences to test each instruction in the microprocessor. By utilizing k -out-of-m codes, they use fewer tests to cover more faults, thereby reducing the test generation time
Keywords
computer testing; microprocessor chips; control fault model; functional testing method; k-out-of-m codes; microprocessors; register transfer language; test generation time; testing requirements; Circuit faults; Circuit testing; Decoding; Fault tolerance; Integrated circuit technology; Kernel; Microprocessors; Registers; Sequential analysis; Very large scale integration;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.5992
Filename
5992
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