Title :
Shape and surface measurement technology by an improved shape-from-shading neural algorithm
Author :
Cho, Siu-Yeung ; Chow, Tommy W S
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, Hong Kong
fDate :
2/1/2000 12:00:00 AM
Abstract :
A new approach for measuring the shape and surface of an object observed from a single camera is proposed. The proposed approach is based on using the neural networks as a parametric representation of the three-dimensional object and the shape-from-shading problem is formulated as the minimization of an intensity error function with respect to the network weights. Experimental results demonstrate that the authors´ proposed methodology exhibits high efficiency and accuracy for measuring and inspecting a product´s surface in the manufacturing industry
Keywords :
image processing; learning (artificial intelligence); neural nets; shape measurement; surface topography measurement; accuracy; efficiency; intensity error function minimisation; manufacturing industry; network weights; parametric representation; product surface inspection; shape measurement technology; shape-from-shading neural algorithm; surface measurement technology; three-dimensional object; Capacitors; Circuit simulation; Conferences; DC-DC power converters; Impedance; Neural networks; Resonance; Shape measurement; Stability; Surface finishing;
Journal_Title :
Industrial Electronics, IEEE Transactions on