Title :
Microstructural and crystallographic aspects of thin film recording media
Author :
Laughlin, David E. ; Lu, Bin ; Hsu, Yu-Nu ; Zou, Jie ; Lambeth, David N.
Author_Institution :
Dept. of Mater. Sci. & Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
Various aspects of the structure of thin film longitudinal recording media are presented and discussed. In particular we discuss the role that the various layers of thin film media play in controlling the microstructure and magnetic properties of the magnetic layer. These include the grain size of the films, the texture of the films, the role of the intermediate layer and the role of chemical segregation.
Keywords :
grain size; magnetic recording; magnetic thin film devices; segregation; surface texture; chemical segregation; crystallographic aspects; film texture; grain size; intermediate layer; magnetic properties; microstructural aspects; thin film recording media; Chromium; Crystallography; Diffraction; Electrons; Epitaxial growth; Grain size; Magnetic films; Magnetic recording; Microstructure; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
