DocumentCode
1302800
Title
Analysis of tape surface roughness by magnetic recording and mechanical methods
Author
Luo, Peng ; Tan, Sanwu ; Bertram, H. Neal ; Hughes, Gordon ; Talke, Frank E.
Author_Institution
Center for Magnetic Recording Res., California Univ., San Diego, La Jolla, CA, USA
Volume
36
Issue
1
fYear
2000
Firstpage
189
Lastpage
194
Abstract
Tape surface roughness noise is a large component of medium noise in high-density tape recording systems. Here, the results of tape surface roughness characterization by both mechanical and magnetic measurements are presented. The goal is to measure and compare both RMS roughness variance σ and roughness correlation length l. The results show that the magnetic recording determination of σ and l agrees extremely well with the mechanical measurements.
Keywords
magnetic recording noise; magnetic tapes; surface topography; correlation length; high density magnetic recording; magnetic measurement; mechanical measurement; tape surface roughness noise; variance; Magnetic analysis; Magnetic heads; Magnetic noise; Magnetic recording; Magnetic variables measurement; Mechanical variables measurement; Optical surface waves; Rough surfaces; Scanning electron microscopy; Surface roughness;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.824447
Filename
824447
Link To Document