Title :
Performance of InGaN/GaN MQW LEDs Using Ga-Doped ZnO TCLs Prepared by ALD
Author :
Yen, Kuo-Yi ; Chiu, Chien-Hua ; Li, Chun-Wei ; Chou, Chien-Hua ; Lin, Pei-Shin ; Chen, Tzu-Pei ; Lin, Tai-Yuan ; Gong, Jyh-Rong
Author_Institution :
Dept. of Phys., Nat. Chung Hsing Univ., Taichung, Taiwan
Abstract :
Heavily Ga-doped ZnO (n±-GZO) films prepared by atomic layer deposition were used as transparent conducting layers (TCLs) on InGaN/GaN multiple quantum well (MQW) light emitting diodes (LEDs). It was found that N2-annealed n+-GZO-coated InGaN/GaN MQW LEDs exhibited reduced forward voltage and enhanced light extraction under certain conditions. A forward voltage of 3.1 V at 20 mA was achieved for a 400°C N2-annealed n+-GZO-coated InGaN/GaN MQW LED with a specific contact resistance of the n+-GZO on p-GaN contact being 4.1 × 10-3 Ω cm2. Compared to the same InGaN/GaN MQW LED structure with a commercial grade indium tin oxide (ITO) TCL, the 400 °C N2-annealed n+-GZO-coated InGaN/GaN MQW LED shows an increment of light output power by 15% at 20 mA. It is believed that the enhanced light extraction of the n+-GZO-coated InGaN/GaN MQW LED is a consequence of a higher refractive index of n+-GZO than that of ITO.
Keywords :
II-VI semiconductors; III-V semiconductors; annealing; atomic layer deposition; contact resistance; gallium; gallium compounds; heavily doped semiconductors; indium compounds; light emitting diodes; quantum well devices; refractive index; wide band gap semiconductors; zinc compounds; ALD; InGaN-GaN-ZnO:Ga; MQW LED; annealing; atomic layer deposition; current 20 mA; heavily Ga-doped ZnO TCL; indium tin oxide; light emitting diodes; light extraction; multiple quantum well; refractive index; specific contact resistance; temperature 400 degC; transparent conducting layers; voltage 3.1 V; Annealing; Films; Gallium nitride; Indium tin oxide; Light emitting diodes; Power generation; Quantum well devices; ALD; GZO; InGaN/GaN multiple quantum well (MQW) light emitting diode (LED); ohmic contact; transparent conducting layer (TCL);
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2012.2220537