• DocumentCode
    1303123
  • Title

    An Investigation of a Novel Snapback-Free Reverse-Conducting IGBT and With Dual Gates

  • Author

    Zhu, Liheng ; Chen, Xingbi

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    59
  • Issue
    11
  • fYear
    2012
  • Firstpage
    3048
  • Lastpage
    3053
  • Abstract
    A novel reverse-conducting insulated-gate bipolar transistor (RC-IGBT) with an automatically controlled anode gate, named AG-RC-IGBT, is proposed in this paper, wherein a gate on the reverse IGBT is intrinsically off in the forward conduction state and can be automatically turned on in the reverse conduction state. Therefore, bidirectional conduction capability with snapback-free characteristics is achieved in the novel RC-IGBT. Depending on the parameters set on the reverse IGBT, its operation mode can be either like an antiparallel IGBT or like an antiparallel MOS-controlled thyristor (MCT). The antiparallel MCT mode can yield low snapback current densities and low on-state voltages in both forward and reverse conductions. Two-dimensional numerical simulations show that snapback-free characteristics are obtained in the AG-RC-IGBT antiparallel with an IGBT by a 15-μm-wide half-pitch in both forward and reverse conduction states. The antiparallel MCT mode achieves low on-state voltages of 0.97 and 1.6 V at the current density of 200 A/cm2 in reverse and forward conduction states, respectively.
  • Keywords
    current density; insulated gate bipolar transistors; numerical analysis; thyristors; AG-RC-IGBT antiparallel; antiparallel IGBT; antiparallel MCT mode; antiparallel MOS-controlled thyristor; automatically controlled anode gate; bidirectional conduction capability; dual gates; forward conduction state; low on-state voltages; reverse conduction state; reverse-conducting insulated-gate bipolar transistor; size 15 mum; snapback current density; snapback-free reverse-conducting IGBT; two-dimensional numerical simulations; voltage 0.97 V; voltage 1.6 V; Bipolar transistors; Current density; Doping; Insulated gate bipolar transistors; Logic gates; Thyristors; Insulated-gate bipolar transistor (IGBT); reverse conducting; snapback; turn off;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2215039
  • Filename
    6316140