DocumentCode
1303659
Title
High-selectivity single-chip spectrometer in silicon for operation in visible part of the spectrum
Author
Correia, José Higino ; Bartek, Marian ; Wolffenbuttel, Reinoud F.
Author_Institution
Dept. of Ind. Electron., Minho Univ., Guimaraes, Portugal
Volume
47
Issue
3
fYear
2000
fDate
3/1/2000 12:00:00 AM
Firstpage
553
Lastpage
559
Abstract
A microspectrometer has been realized based on an array of Fabry-Perot optical thin-film filters. The 16-channel microspectrometer is compatible with IC fabrication methods and operates in the visible spectral range with an interchannel shift of 6 nm. Each of the channels is sensitive in a single peak with full-width-half-maximum (FWHM) of 16 nm. Also a FWHM below 2 nm and finesse of 40 for narrow band operation is demonstrated. The device can easily be tuned during fabrication to cover a different spectral band only by adjusting the etching times without affecting the device layout. Such a device is extremely suitable for applications in microsystems because of its small size, high spectral selectivity, and low cost. Microspectrometers for the UV and IR regions are also feasible using this technique
Keywords
Fabry-Perot interferometers; elemental semiconductors; interference spectrometers; optical filters; silicon; visible spectrometers; FWHM; Fabry-Perot optical thin-film filters; Si; device layout; etching times; high-selectivity single-chip spectrometer; interchannel shift; microspectrometer; narrow band operation; spectral selectivity; Costs; Etching; Fabry-Perot; Narrowband; Optical arrays; Optical device fabrication; Optical films; Optical filters; Silicon; Spectroscopy;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.824727
Filename
824727
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