• DocumentCode
    1303659
  • Title

    High-selectivity single-chip spectrometer in silicon for operation in visible part of the spectrum

  • Author

    Correia, José Higino ; Bartek, Marian ; Wolffenbuttel, Reinoud F.

  • Author_Institution
    Dept. of Ind. Electron., Minho Univ., Guimaraes, Portugal
  • Volume
    47
  • Issue
    3
  • fYear
    2000
  • fDate
    3/1/2000 12:00:00 AM
  • Firstpage
    553
  • Lastpage
    559
  • Abstract
    A microspectrometer has been realized based on an array of Fabry-Perot optical thin-film filters. The 16-channel microspectrometer is compatible with IC fabrication methods and operates in the visible spectral range with an interchannel shift of 6 nm. Each of the channels is sensitive in a single peak with full-width-half-maximum (FWHM) of 16 nm. Also a FWHM below 2 nm and finesse of 40 for narrow band operation is demonstrated. The device can easily be tuned during fabrication to cover a different spectral band only by adjusting the etching times without affecting the device layout. Such a device is extremely suitable for applications in microsystems because of its small size, high spectral selectivity, and low cost. Microspectrometers for the UV and IR regions are also feasible using this technique
  • Keywords
    Fabry-Perot interferometers; elemental semiconductors; interference spectrometers; optical filters; silicon; visible spectrometers; FWHM; Fabry-Perot optical thin-film filters; Si; device layout; etching times; high-selectivity single-chip spectrometer; interchannel shift; microspectrometer; narrow band operation; spectral selectivity; Costs; Etching; Fabry-Perot; Narrowband; Optical arrays; Optical device fabrication; Optical films; Optical filters; Silicon; Spectroscopy;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.824727
  • Filename
    824727