DocumentCode :
1303733
Title :
A dependable high performance wafer scale architecture for embedded signal processing
Author :
Linderman, Richard W. ; Kohler, Ralph L R ; Linderman, Mark H.
Author_Institution :
US Air Force Res. Lab., Rome, NY., USA
Volume :
47
Issue :
1
fYear :
1998
fDate :
1/1/1998 12:00:00 AM
Firstpage :
125
Lastpage :
128
Abstract :
A high performance, programmable, floating point multiprocessor architecture has been specifically designed to exploit advanced two- and three-dimensional hybrid wafer scale packaging to achieve low size, weight, and power, and improve reliability for embedded systems applications. Processing elements comprised of a 0.8 micron CMOS dual processor chip and commercial synchronous SRAMs achieve more than 100 MFLOPS/Watt. This power efficiency allows up to 32 processing elements to be incorporated into a single 3D multichip module, eliminating multiple discrete packages and thousands of wirebonds. The dual processor chip can dynamically switch between independent processing, watchdog checking, and coprocessing modes. A flat, SRAM memory provides predictable instruction set timing and independent and accurate performance prediction
Keywords :
digital signal processing chips; multiprocessing systems; real-time systems; signal processing; 0.8 micron; 100 MFLOPS; 3D multichip module; dual processor chip; embedded signal processing; embedded systems; floating point multiprocessor; high performance; reliability; synchronous SRAMs; wafer scale architecture; wafer scale packaging; watchdog checking; CMOS process; Computer architecture; Embedded system; Integrated circuit interconnections; Multichip modules; Packaging; Power system reliability; Signal processing; Switches; Wafer scale integration;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.656096
Filename :
656096
Link To Document :
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