DocumentCode :
1303795
Title :
Test Technology TC Newsletter
Volume :
26
Issue :
4
fYear :
2009
Firstpage :
102
Lastpage :
103
Keywords :
Conferences; Fault tolerance; Fault tolerant systems; Security; Testing; Very large scale integration;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2009.87
Filename :
5209970
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1303795
