DocumentCode :
1303995
Title :
AlGaInP multiquantum well light-emitting diodes
Author :
Chang, S.J. ; Chang, C.S. ; Su, Y.K. ; Chang, P.T. ; Wu, Y.R. ; Huang, K.H. ; Chen, T.P.
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume :
144
Issue :
6
fYear :
1997
fDate :
12/1/1997 12:00:00 AM
Firstpage :
405
Lastpage :
410
Abstract :
AlGaInP DH, DH+DBR and MQW LEDs were fabricated and their luminescence properties were compared. It was found that AlGaInP MQW LEDs are brighter than DH and DH+DBR LEDs, particularly under low current injection. For MQW LEDs, the EL intensity will increase as the number of wells increases. Furthermore, the output intensity is also a function of the barrier layer thickness lB. As lB increases, the EL intensity will become larger. Reliability tests under DC and pulse operation were measured and it was found that the AlGaInP MQW LEDs used in this study are more reliable than the DH+DBR LED. Under pulse operation it was found that, as the the number of wells increases, the amount of decay will become smaller
Keywords :
III-V semiconductors; aluminium compounds; brightness; electroluminescence; gallium compounds; indium compounds; light emitting diodes; semiconductor device reliability; semiconductor quantum wells; AlGaInP; AlGaInP multiquantum well light-emitting diodes; DBR LED; DC operation; DH LED; EL intensity; MQW LED; barrier layer thickness; decay; low current injection; luminescence properties; output intensity; pulse operation; reliability tests;
fLanguage :
English
Journal_Title :
Optoelectronics, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2433
Type :
jour
DOI :
10.1049/ip-opt:19971554
Filename :
656373
Link To Document :
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