Author :
Jain, Anil K. ; Duin, Robert P W ; Mao, Jianchang
Author_Institution :
Dept. of Comput. Sci. & Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
The primary goal of pattern recognition is supervised or unsupervised classification. Among the various frameworks in which pattern recognition has been traditionally formulated, the statistical approach has been most intensively studied and used in practice. More recently, neural network techniques and methods imported from statistical learning theory have been receiving increasing attention. The design of a recognition system requires careful attention to the following issues: definition of pattern classes, sensing environment, pattern representation, feature extraction and selection, cluster analysis, classifier design and learning, selection of training and test samples, and performance evaluation. In spite of almost 50 years of research and development in this field, the general problem of recognizing complex patterns with arbitrary orientation, location, and scale remains unsolved. New and emerging applications, such as data mining, web searching, retrieval of multimedia data, face recognition, and cursive handwriting recognition, require robust and efficient pattern recognition techniques. The objective of this review paper is to summarize and compare some of the well-known methods used in various stages of a pattern recognition system and identify research topics and applications which are at the forefront of this exciting and challenging field
Keywords :
Bayes methods; decision theory; learning (artificial intelligence); neural nets; parameter estimation; pattern recognition; classifier design; cluster analysis; complex patterns; cursive handwriting recognition; data mining; multimedia data retrieval; neural network techniques; pattern classes; pattern representation; performance evaluation; sensing environment; statistical learning theory; statistical pattern recognition; supervised classification; unsupervised classification; web searching; Data mining; Feature extraction; Information retrieval; Neural networks; Pattern analysis; Pattern recognition; Performance analysis; Research and development; Statistical learning; System testing;