Title :
Twenty years of document image analysis in PAMI
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
fDate :
1/1/2000 12:00:00 AM
Abstract :
The contributions to document image analysis of 99 papers published in the IEEE Transactions on Pattern Analysis and Machine Intelligence (PAMI) are clustered, summarized, interpolated, interpreted, and evaluated
Keywords :
document image processing; optical character recognition; reviews; IEEE Transactions on Pattern Analysis and Machine Intelligence; document image analysis; forms processing; graphics recognition; Character recognition; Conferences; Graphics; Image analysis; Image edge detection; Image processing; Optical character recognition software; Pattern recognition; Senior members; Text analysis;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
