Title :
GaAs W-band IMPATT diodes for very low-noise oscillators
Author_Institution :
Tech. Univ., Munchen, West Germany
Abstract :
W-band single-drift flat-profile IMPATT diodes were fabricated from GaAs MBE material and tested in a full-height waveguide resonant cavity with resonant cap. A quasi-optical parabolic Fabry-Perot resonator was used to determine the FM noise of the GaAs IMPATT oscillator. With a minimum noise measure of 20 dB at power levels around 20 mW, IMPATT diode oscillators can compete well with oscillators using Gunn devices. The (N/C)FM=-82 dBc measured at 100 kHz frequency off-carrier and at QEX=95 is comparable to the value obtained from Gunn devices. The maximum available output power of 270 mW, however, markedly exceeds that of Gunn oscillators.
Keywords :
III-V semiconductors; IMPATT diodes; electron device noise; gallium arsenide; microwave oscillators; semiconductor device testing; 270 mW; FM noise; GaAs; III-V semiconductors; IMPATT diodes; MBE material; W-band; flat-profile; full-height waveguide resonant cavity; low-noise oscillators; parabolic Fabry-Perot resonator; quasioptical resonator; resonant cap; single-drift; solid state microwave devices;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19900075