• DocumentCode
    1304254
  • Title

    Linear feedback shift register design using cyclic codes

  • Author

    Wang, Laung-Terng ; McCluskey, Edward J.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Stanford Univ., CA, USA
  • Volume
    37
  • Issue
    10
  • fYear
    1988
  • fDate
    10/1/1988 12:00:00 AM
  • Firstpage
    1302
  • Lastpage
    1306
  • Abstract
    A design technique is given for linear-feedback shift registers (LFSR) that generate test patterns for pseudoexhaustive testing of networks with restricted output dependency. This technique is based on cyclic code theory. Examples indicate that LFSRs based on cyclic codes are easier to implement and have lower hardware overhead than LFSRs that use other linear codes
  • Keywords
    codes; feedback; shift registers; cyclic codes; design technique; linear-feedback shift registers; pseudoexhaustive testing; test patterns; Automatic testing; Built-in self-test; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Hardware; Linear code; Linear feedback shift registers; Test pattern generators;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.5994
  • Filename
    5994
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1304254