DocumentCode :
1304288
Title :
Application of the photo-elastic method to measurement of dynamic stress distribution for NS-GT cut quartz crystal resonators
Author :
Yamagata, Sekiji ; Kawashima, Hirofumi ; Sunaga, Kenji
Author_Institution :
Hokkaido Univ. of Educ., Japan
Volume :
44
Issue :
6
fYear :
1997
Firstpage :
1297
Lastpage :
1303
Abstract :
NS-GT cut quartz crystal resonators are widely used as a frequency standard element in consumer products and communication equipment. The vibration mode of the resonators was analyzed by the finite element method (FEM) because they have a complicated shape. As a result, an asymmetrical vibration mode at the main resonant frequency has been obtained by the FEM simulation. But, it is necessary to confirm the asymmetrical vibration mode experimentally because it is just a simulation. In this paper, stress distributions of the NS-GT cut quartz crystal resonators are measured experimentally by using a dynamic photo-elastic method when the resonators are vibrating in the resonant frequency; thereafter, vibration modes of the NS-GT cut resonators are estimated with the experimental data of the stress distributions. This experiment for the NS-GT cut quartz crystal resonators exposes the existence of a twisted asymmetrical vibration mode at the main resonant frequency, with the magnitude of the twisted vibration in proportion to thickness of the resonators.
Keywords :
crystal resonators; finite element analysis; photoelasticity; quartz; stress measurement; vibrations; FEM simulation; NS-GT cut quartz crystal resonator; SiO/sub 2/; dynamic photoelastic method; finite element method; frequency standard; stress distribution measurement; twisted asymmetrical vibration mode; Communication equipment; Communication standards; Consumer products; Finite element methods; Frequency estimation; Frequency measurement; Resonant frequency; Shape; Stress measurement; Vibration measurement;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.656633
Filename :
656633
Link To Document :
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