• DocumentCode
    1304288
  • Title

    Application of the photo-elastic method to measurement of dynamic stress distribution for NS-GT cut quartz crystal resonators

  • Author

    Yamagata, Sekiji ; Kawashima, Hirofumi ; Sunaga, Kenji

  • Author_Institution
    Hokkaido Univ. of Educ., Japan
  • Volume
    44
  • Issue
    6
  • fYear
    1997
  • Firstpage
    1297
  • Lastpage
    1303
  • Abstract
    NS-GT cut quartz crystal resonators are widely used as a frequency standard element in consumer products and communication equipment. The vibration mode of the resonators was analyzed by the finite element method (FEM) because they have a complicated shape. As a result, an asymmetrical vibration mode at the main resonant frequency has been obtained by the FEM simulation. But, it is necessary to confirm the asymmetrical vibration mode experimentally because it is just a simulation. In this paper, stress distributions of the NS-GT cut quartz crystal resonators are measured experimentally by using a dynamic photo-elastic method when the resonators are vibrating in the resonant frequency; thereafter, vibration modes of the NS-GT cut resonators are estimated with the experimental data of the stress distributions. This experiment for the NS-GT cut quartz crystal resonators exposes the existence of a twisted asymmetrical vibration mode at the main resonant frequency, with the magnitude of the twisted vibration in proportion to thickness of the resonators.
  • Keywords
    crystal resonators; finite element analysis; photoelasticity; quartz; stress measurement; vibrations; FEM simulation; NS-GT cut quartz crystal resonator; SiO/sub 2/; dynamic photoelastic method; finite element method; frequency standard; stress distribution measurement; twisted asymmetrical vibration mode; Communication equipment; Communication standards; Consumer products; Finite element methods; Frequency estimation; Frequency measurement; Resonant frequency; Shape; Stress measurement; Vibration measurement;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.656633
  • Filename
    656633