• DocumentCode
    1304583
  • Title

    Single-Turn Fault Detection in Induction Machine Using Complex-Wavelet-Based Method

  • Author

    Seshadrinath, Jeevanand ; Singh, Bawa ; Panigrahi, B.K.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol. Delhi, New Delhi, India
  • Volume
    48
  • Issue
    6
  • fYear
    2012
  • Firstpage
    1846
  • Lastpage
    1854
  • Abstract
    Interturn short circuit is often confused with voltage imbalance in induction machines. Therefore, detection and classification of single-turn fault (TF) are becoming important in the presence of voltage imbalances, under various loading conditions. Substantial studies are conducted on the interturn fault detection, but a comprehensive method for classifying the faults at different operating points of the machine, under varying supply conditions, is still a challenge. This is a critical problem in industries since the induction motors form the major workhorses. The artificial-intelligence-based techniques are advanced methods in fault monitoring. This, when combined with optimization techniques, is expected to give improved and accurate results with minimum false alarms. In this paper, a technique is developed, based on recent developments in the wavelet-based analysis, particularly in the complex wavelet domain. The support vector machines are adopted for comparing the classification accuracy obtained using complex-wavelet- and standard discrete-wavelet-based methods. The receiver operating characteristic curves indicate that the fault detection, down to single turn, is feasible using a single current sensor.
  • Keywords
    artificial intelligence; asynchronous machines; fault diagnosis; optimisation; short-circuit currents; wavelet transforms; artificial-intelligence-based techniques; complex-wavelet-based method; induction machine; interturn fault detection; interturn short circuit; loading conditions; optimization techniques; single current sensor; single-turn fault detection; standard discrete-wavelet-based methods; voltage imbalances; wavelet-based analysis; Circuit faults; Discrete wavelet transforms; Filter banks; Support vector machines; Wavelet analysis; Complex wavelets; fault detection; feature extraction; induction machines; supply imbalance; support vector machine (SVM);
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2012.2222012
  • Filename
    6319384