DocumentCode :
1304965
Title :
Parameter estimation in strongly nonlinear circuits
Author :
Van Den Eijnde, Eli ; Schoukens, Johan
Author_Institution :
Vrije Univ., Brussels, Belgium
Volume :
39
Issue :
6
fYear :
1990
fDate :
12/1/1990 12:00:00 AM
Firstpage :
853
Lastpage :
859
Abstract :
The combination of the generalized Volterra approach to compute the steady-state output of strongly nonlinear systems with the maximum likelihood estimator (MLE) developed by J. Schoukens et al. (see ibid., vol.IM-37, p.10-17, 1988) yields a powerful tool to estimate the parameters in strongly nonlinear circuits. As a result, it is possible to determine system characteristics that cannot be measured directly or are difficult to obtain. The latter is illustrated by means of an inverting amplifier built around an operational amplifier causing slew-induced distortion. Two different models are used to represent the operational amplifier. The first considers only one nonlinearity, namely a saturating current source characterized by two parameters, but can only describe symmetric slew-induced distortion. The other model uses two diodes and results in a six-parameter model capable of addressing the asymmetric case. By comparing the results obtained for these approaches with measurements on the actual circuit, the capability of the identification technique for strongly nonlinear systems is demonstrated
Keywords :
electric distortion; estimation theory; linearisation techniques; nonlinear network analysis; operational amplifiers; parameter estimation; Volterra; asymmetric distortion; diodes; identification; inverting amplifier; maximum likelihood estimator; operational amplifier; parameter estimation; saturating current source; six-parameter model; slew-induced distortion; steady state analysis; steady-state output; strongly nonlinear circuits; symmetric distortion; Distortion measurement; Maximum likelihood estimation; Nonlinear circuits; Nonlinear distortion; Nonlinear systems; Operational amplifiers; Parameter estimation; Power system modeling; Steady-state; Yield estimation;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.65782
Filename :
65782
Link To Document :
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