• DocumentCode
    1305030
  • Title

    A framework for design and testing of analog integrated circuits

  • Author

    Soenen, Eric G. ; VanPeteghem, Peter M. ; Liu, Hu-Chen ; Narayan, Sriram ; Cummings, James T.

  • Author_Institution
    Texas A&M Univ., College Station, TX, USA
  • Volume
    39
  • Issue
    6
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    890
  • Lastpage
    893
  • Abstract
    A global methodology for analog and mixed analog-to-digital VLSI design requires close interaction between simulations, CAD tools, measurements, and testing. An integrated hardware and software environment (framework) that implements this methodology in a systematic way is described. As an example of its application, the modeling of errors in multistage analog-to-digital converters (ADCs) is described. The framework has a unique software organization designed to facilitate the interpretation of measurement results and the feedback of information to the design world. The perfectly modular nature of the software makes it easy to gain a fundamental understanding of error mechanisms. In the ADC example, this understanding eliminates the need to probe internal parts of a circuit since information on internal errors can be recovered from external measurements
  • Keywords
    VLSI; analogue-digital conversion; application specific integrated circuits; circuit CAD; linear integrated circuits; A/D convertor; CAD; analog integrated circuits; design; integrated hardware and software environment; mixed analog-to-digital VLSI design; modeling of errors; modular software; multistage analog-to-digital converters; simulations; testing; Analog integrated circuits; Application software; Circuit simulation; Circuit testing; Computer errors; Design automation; Hardware; Integrated circuit measurements; Integrated circuit testing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.65791
  • Filename
    65791