Title :
Thermal testing on reconfigurable computers
Author :
Lopez-Buedo, Sergio ; Garrido, Javier ; Boemo, Eduardo
Author_Institution :
Univ. Autonoma de Madrid, Spain
Abstract :
Ring-oscillators are useful to monitor the thermal status of reconfigurable computers. No analog parts exist, and the sensors can be dynamically inserted, moved, or eliminated
Keywords :
computer testing; reconfigurable architectures; thermal analysis; reconfigurable computers; ring-oscillators; thermal status; thermal testing; Circuit testing; Computer aided manufacturing; Electronic packaging thermal management; Field programmable gate arrays; Hardware; Oscillators; Semiconductor device measurement; Sensor systems; Temperature sensors; Thermal sensors;
Journal_Title :
Design & Test of Computers, IEEE
