• DocumentCode
    1305092
  • Title

    Thermal testing on reconfigurable computers

  • Author

    Lopez-Buedo, Sergio ; Garrido, Javier ; Boemo, Eduardo

  • Author_Institution
    Univ. Autonoma de Madrid, Spain
  • Volume
    17
  • Issue
    1
  • fYear
    2000
  • Firstpage
    84
  • Lastpage
    91
  • Abstract
    Ring-oscillators are useful to monitor the thermal status of reconfigurable computers. No analog parts exist, and the sensors can be dynamically inserted, moved, or eliminated
  • Keywords
    computer testing; reconfigurable architectures; thermal analysis; reconfigurable computers; ring-oscillators; thermal status; thermal testing; Circuit testing; Computer aided manufacturing; Electronic packaging thermal management; Field programmable gate arrays; Hardware; Oscillators; Semiconductor device measurement; Sensor systems; Temperature sensors; Thermal sensors;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.825679
  • Filename
    825679
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1305092