• DocumentCode
    1305100
  • Title

    A new time-domain approach for determining the complex permittivity using stripline geometry

  • Author

    Fidanboylu, Kemal M. ; Riad, Sedki M. ; Elshabini-Riad, A.

  • Author_Institution
    Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    39
  • Issue
    6
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    940
  • Lastpage
    944
  • Abstract
    A time-domain approach for determining the complex permittivity of materials using stripline geometry is presented. The technique uses time-domain reflectometry (TDR) measurements and computer simulation to determine an optimum lossy transmission-line model characterizing the stripline under test. The line model is then used for determining the complex permittivity of the dielectric material. The validity of the technique is demonstrated by using a stripline constructed from Rogers RT/Duroid composite laminate and one constructed from thick-film paste. Accurate estimates for both the Duroid´s and the thick film paste´s dielectric constant were obtained. The technique is incapable of determining the loss tangent if the mismatch between the step generator and the stripline under test is very high and the loss tangent is fairly small
  • Keywords
    computerised instrumentation; dielectric loss measurement; digital simulation; laminates; microcomputer applications; microwave reflectometry; permittivity measurement; strip lines; thick films; time-domain reflectometry; transmission line theory; Rogers RT/Duroid composite laminate; complex permittivity; computer simulation; dielectric constant; dielectric material; loss tangent; mismatch; optimum lossy transmission-line model; stripline geometry; thick-film paste; time-domain reflectometry; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Geometry; Loss measurement; Permittivity measurement; Reflectometry; Stripline; Testing; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.65802
  • Filename
    65802