DocumentCode
1305134
Title
Digital spectra of nonuniformly sampled signals: theories and applications-measuring clock/aperture jitter of an A/D system
Author
Jenq, Y.C.
Author_Institution
Tektronix Inc., Beaverton, OR, USA
Volume
39
Issue
6
fYear
1990
fDate
12/1/1990 12:00:00 AM
Firstpage
969
Lastpage
971
Abstract
Theories and applications of a digital spectrum analysis technique for a class of nonuniformly sampled signals are described. A method based on asynchronous spectral averaging is presented to measure the standard deviation of a clock/aperture jitter of an A/D (analog/digital) system. A sine wave with frequency f 0 is used as the input test signal to an A/D system. Spectral averaging is performed on many asynchronously acquired data records with length N . The jitter standard deviation is calculated from the measured signal-to-noise (S /N ) floor ratio. The expression which relates the S /N to the standard deviation, σr, of the jitter, r , is derived in closed form. Graphs showing good agreement between the theoretical equation and the simulation results are presented
Keywords
analogue-digital conversion; electric distortion measurement; electric noise measurement; signal processing; spectral analysis; A/D system; S/N ratio; asynchronous spectral averaging; asynchronously acquired data; clock/aperture jitter; digital spectrum analysis; jitter standard deviation; nonuniformly sampled signals; simulation; sine wave; standard deviation; Apertures; Clocks; Distortion measurement; Frequency; Jitter; Measurement standards; Noise measurement; Performance evaluation; Sampling methods; Silicon compounds;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.65808
Filename
65808
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