DocumentCode :
1305134
Title :
Digital spectra of nonuniformly sampled signals: theories and applications-measuring clock/aperture jitter of an A/D system
Author :
Jenq, Y.C.
Author_Institution :
Tektronix Inc., Beaverton, OR, USA
Volume :
39
Issue :
6
fYear :
1990
fDate :
12/1/1990 12:00:00 AM
Firstpage :
969
Lastpage :
971
Abstract :
Theories and applications of a digital spectrum analysis technique for a class of nonuniformly sampled signals are described. A method based on asynchronous spectral averaging is presented to measure the standard deviation of a clock/aperture jitter of an A/D (analog/digital) system. A sine wave with frequency f0 is used as the input test signal to an A/D system. Spectral averaging is performed on many asynchronously acquired data records with length N. The jitter standard deviation is calculated from the measured signal-to-noise (S/N) floor ratio. The expression which relates the S/N to the standard deviation, σr, of the jitter, r, is derived in closed form. Graphs showing good agreement between the theoretical equation and the simulation results are presented
Keywords :
analogue-digital conversion; electric distortion measurement; electric noise measurement; signal processing; spectral analysis; A/D system; S/N ratio; asynchronous spectral averaging; asynchronously acquired data; clock/aperture jitter; digital spectrum analysis; jitter standard deviation; nonuniformly sampled signals; simulation; sine wave; standard deviation; Apertures; Clocks; Distortion measurement; Frequency; Jitter; Measurement standards; Noise measurement; Performance evaluation; Sampling methods; Silicon compounds;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.65808
Filename :
65808
Link To Document :
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