• DocumentCode
    1305134
  • Title

    Digital spectra of nonuniformly sampled signals: theories and applications-measuring clock/aperture jitter of an A/D system

  • Author

    Jenq, Y.C.

  • Author_Institution
    Tektronix Inc., Beaverton, OR, USA
  • Volume
    39
  • Issue
    6
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    969
  • Lastpage
    971
  • Abstract
    Theories and applications of a digital spectrum analysis technique for a class of nonuniformly sampled signals are described. A method based on asynchronous spectral averaging is presented to measure the standard deviation of a clock/aperture jitter of an A/D (analog/digital) system. A sine wave with frequency f0 is used as the input test signal to an A/D system. Spectral averaging is performed on many asynchronously acquired data records with length N. The jitter standard deviation is calculated from the measured signal-to-noise (S/N) floor ratio. The expression which relates the S/N to the standard deviation, σr, of the jitter, r, is derived in closed form. Graphs showing good agreement between the theoretical equation and the simulation results are presented
  • Keywords
    analogue-digital conversion; electric distortion measurement; electric noise measurement; signal processing; spectral analysis; A/D system; S/N ratio; asynchronous spectral averaging; asynchronously acquired data; clock/aperture jitter; digital spectrum analysis; jitter standard deviation; nonuniformly sampled signals; simulation; sine wave; standard deviation; Apertures; Clocks; Distortion measurement; Frequency; Jitter; Measurement standards; Noise measurement; Performance evaluation; Sampling methods; Silicon compounds;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.65808
  • Filename
    65808