Title :
Optical measurements based on RF modulation techniques
Author_Institution :
Hewlett-Packard Co., Santa Rosa, CA, USA
fDate :
12/1/1990 12:00:00 AM
Abstract :
A characterization concept is introduced for high-speed lightwave components based on high-frequency RF modulation of the test signals. The concept is explained by using the example of optical transmission measurements covering optical loss, modulation bandwidth, and length measurements. Optical reflection measurements are investigated with the capability of separating multiple reflections. Responsivity measurements of electrooptical devices such as lasers and photodiodes are investigated. The described concepts are utilized in the first commercially available instrumentation systems covering a modulation bandwidth up to 20 GHz
Keywords :
laser variables measurement; optical fibres; optical links; optical loss measurement; optical losses; optical testing; optical variables measurement; reflectometry; spectral analysers; 20 GHz; RF modulation; bit error rate; electrooptical devices; fiber optic communications; high-speed lightwave components; lasers; length measurements; modulation bandwidth; multiple reflections; optical loss; optical reflection measurement; optical transmission measurements; photodiodes; propagation delay; responsivity measurement; Bandwidth; High speed optical techniques; Length measurement; Loss measurement; Optical losses; Optical modulation; Optical reflection; RF signals; Radio frequency; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
