• DocumentCode
    1305196
  • Title

    On the measurement and the modeling of the correlated noise sources corrupting the marine geological echosounding experiments

  • Author

    Peirlinckx, Luc ; Van Biesen, Leo P. ; Masyn, Serge ; Wartel, Stanislas

  • Author_Institution
    Dept. of Fundamental Electr. & Instrum., Vrije Univ., Brussels, Belgium
  • Volume
    39
  • Issue
    6
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    1018
  • Lastpage
    1023
  • Abstract
    The application of well-established time-series analysis techniques to the modeling of echogram noise processes present in acoustic measurements obtained in a marine environment is examined. Starting from short data records, which are obtained by applying an appropriate Dirichlet-type time window to the sampled reflectogram in such a way that only the noise signals are acquired, it is shown that low-order parametric models are adequate to describe the observed and measured noise sources. The obtained noise models allow the validation of the synthetic generated echograms, which describe the current acoustic-wave propagation phenomena in the marine environment studied
  • Keywords
    acoustic noise measurement; acoustic radiators; acoustic signal processing; acoustic wave propagation; echo; geology; geophysical techniques; oceanographic techniques; reflectometry; signal processing equipment; sonar; spectral analysis; time series; underwater sound; ARMA; Dirichlet-type time window; acoustic measurements; acoustic reflectometry; correlated noise sources; echogram noise; low-order parametric models; marine geological echosounding experiments; measurement; modeling; noise signals; oceanographic techniques; sampled reflectogram; synthetic generated echograms; time-series analysis; underwater sound; Acoustic measurements; Acoustic noise; Acoustic waves; Geologic measurements; Geology; Instruments; Noise measurement; Probes; Sediments; Working environment noise;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.65818
  • Filename
    65818