Title :
ThriftStore: Finessing Reliability Trade-Offs in Replicated Storage Systems
Author :
Gharaibeh, Abdullah ; Al-Kiswany, Samer ; Ripeanu, Matei
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of British Columbia, Vancouver, BC, Canada
fDate :
6/1/2011 12:00:00 AM
Abstract :
This paper explores the feasibility of a storage architecture that offers the reliability and access performance characteristics of a high-end system, yet is cost-efficient. We propose ThriftStore, a storage architecture that integrates two types of components: volatile, aggregated storage and dedicated, yet low-bandwidth durable storage. On the one hand, the durable storage forms a back end that enables the system to restore the data the volatile nodes may lose. On the other hand, the volatile nodes provide a high-throughput front-end. Although integrating these components has the potential to offer a unique combination of high throughput and durability at a low cost, a number of concerns need to be addressed to architect and correctly provision the system. To this end, we develop analytical and simulation-based tools to evaluate the impact of system characteristics (e.g., bandwidth limitations on the durable and the volatile nodes) and design choices (e.g., the replica placement scheme) on data availability and the associated system costs (e.g., maintenance traffic). Moreover, to demonstrate the high-throughput properties of the proposed architecture, we prototype a GridFTP server based on ThriftStore. Our evaluation demonstrates an impressive, up to 800 Mbps transfer throughput for the new GridFTP service.
Keywords :
distributed processing; storage management; GridFTP server; GridFTP service; ThriftStore storage architecture; aggregated storage; durable storage; replicated storage systems; Analytical models; Availability; Bandwidth; Maintenance engineering; Peer to peer computing; Redundancy; Throughput; Distributed storage; low-cost storage.; modeling storage reliability trade-offs;
Journal_Title :
Parallel and Distributed Systems, IEEE Transactions on
DOI :
10.1109/TPDS.2010.157