• DocumentCode
    1305364
  • Title

    Noise of strongly-multimode laser diodes used in interferometric systems

  • Author

    Wentworth, Robert H.

  • Author_Institution
    Edward Ginzton Lab., Stanford Univ., CA, USA
  • Volume
    26
  • Issue
    3
  • fYear
    1990
  • fDate
    3/1/1990 12:00:00 AM
  • Firstpage
    426
  • Lastpage
    442
  • Abstract
    A unified model of the phase and partition noise of a multimode semiconductor injection laser is presented in the context of the assumption that all modes radiate the same average optical power. Noise is shown to be associated with two processes: phase fluctuations common to all modes, arising from carrier fluctuations, and partition and phase fluctuations describable in terms of a random walk of the optical field state on the surface of an abstract sphere. Both processes are driven by spontaneous emission. The model is solved analytically; results for the intensity noise level to be expected at the output of an unbalanced interferometer illuminated by a multimode diode laser are derived. These predictions are confirmed experimentally using a laser with nine modes at full width half maximum
  • Keywords
    electron device noise; fluctuations; laser modes; light interferometers; semiconductor device models; semiconductor junction lasers; abstract sphere; average optical power; carrier fluctuations; full width half maximum; intensity noise level; interferometer output noise; interferometric systems; laser diode noise; laser modes; model; multimode semiconductor injection laser; optical field state; partition fluctuations; partition noise; phase fluctuations; phase noise; random walk; sphere surface random walk; spontaneous emission; statistics; strongly-multimode laser diodes; unbalanced interferometer; Context modeling; Diode lasers; Fluctuations; Laser modes; Laser noise; Optical interferometry; Optical noise; Phase noise; Power lasers; Semiconductor device noise;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.52118
  • Filename
    52118