DocumentCode
1305773
Title
Novel method of estimation flicker frequency noise in lasers
Author
Ishida, Osamu
Author_Institution
NTT Transmisions Syst. Lab., Kanagawa, Japan
Volume
2
Issue
11
fYear
1990
Firstpage
784
Lastpage
786
Abstract
A simple method is proposed for the precise measurement of flicker (1/f) frequency noise in lasers. The method is based on measurement of the Allan variance of beat signals produced by delayed self-heterodyning. A simple relation between measured variance and frequency-noise spectrum is derived analytically. Measurement on a 1.5- mu m semiconductor laser diode is presented. It is pointed out that since the method possesses the great advantage of insensitivity to optical power fluctuations, it can be widely used for precisely testing laser frequency quality.<>
Keywords
demodulation; electron device noise; frequency measurement; laser variables measurement; semiconductor junction lasers; 1.5 micron; Allan variance; beat signals; delayed self-heterodyning; flicker frequency noise; frequency-noise spectrum; laser frequency quality testing; laser noise measurement; measured variance; semiconductor laser diode; 1f noise; Analysis of variance; Delay; Diode lasers; Frequency estimation; Frequency measurement; Laser noise; Noise measurement; Semiconductor device noise; Semiconductor lasers;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/68.63220
Filename
63220
Link To Document