DocumentCode :
1306484
Title :
Test generation for multiple state-table faults in finite-state machines
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
Volume :
46
Issue :
7
fYear :
1997
fDate :
7/1/1997 12:00:00 AM
Firstpage :
783
Lastpage :
794
Abstract :
A test generation procedure to detect multiple state-table faults in finite-state machines is proposed. The importance of multiple state-table faults and their advantages as test generation objectives to avoid the need for checking experiments are considered. The proposed procedure is based on a new method for implicit enumeration of large numbers of multiple faults by using incompletely specified faulty machines. Experimental results are presented to demonstrate the effectiveness of implicit fault enumeration in detecting large numbers of multiple faults and in guaranteeing detection of all the faults or all the faults up to a specific multiplicity
Keywords :
fault location; finite state machines; logic testing; finite-state machines; implicit enumeration; implicit fault enumeration; multiple state-table faults; test generation; Error correction; Fault detection; Logic testing; Testing;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.599899
Filename :
599899
Link To Document :
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