• DocumentCode
    1306508
  • Title

    A self-testing nonincreasing order checker

  • Author

    Tao, D.L.

  • Author_Institution
    Dept. of Electr. Eng., State Univ. of New York, Stony Brook, NY, USA
  • Volume
    46
  • Issue
    7
  • fYear
    1997
  • fDate
    7/1/1997 12:00:00 AM
  • Firstpage
    817
  • Lastpage
    820
  • Abstract
    In this paper, we design a new class of self-testing checkers, self-testing nonincreasing order checkers, for the first time. The self-testing nonincreasing order checker is a critical component to design concurrent checking VLSI sorters because it is capable of checking whether an arbitrary long sequence of numbers has been sorted, as well as testing itself during normal system operation
  • Keywords
    VLSI; automatic testing; error detection; fault tolerant computing; sorting; concurrent checking VLSI sorters; self-testing nonincreasing order checker; Automatic testing; Built-in self-test; Circuit faults; Electrical fault detection; Error correction; Fault detection; Fault tolerance; Sorting; System testing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.599902
  • Filename
    599902
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1306508