Title :
A self-testing nonincreasing order checker
Author_Institution :
Dept. of Electr. Eng., State Univ. of New York, Stony Brook, NY, USA
fDate :
7/1/1997 12:00:00 AM
Abstract :
In this paper, we design a new class of self-testing checkers, self-testing nonincreasing order checkers, for the first time. The self-testing nonincreasing order checker is a critical component to design concurrent checking VLSI sorters because it is capable of checking whether an arbitrary long sequence of numbers has been sorted, as well as testing itself during normal system operation
Keywords :
VLSI; automatic testing; error detection; fault tolerant computing; sorting; concurrent checking VLSI sorters; self-testing nonincreasing order checker; Automatic testing; Built-in self-test; Circuit faults; Electrical fault detection; Error correction; Fault detection; Fault tolerance; Sorting; System testing; Very large scale integration;
Journal_Title :
Computers, IEEE Transactions on
