Title :
Zone-melting-recrystallization silicon-on-insulator technology
Author_Institution :
Lincoln Lab., MIT, Cambridge, MA, USA
fDate :
7/1/1987 12:00:00 AM
Abstract :
Continuing reduction in feature size and increase in the number of components per chip have been basic trends in the evolution of Si integrated circuits (ICs). The minimum feature size in commercial VLSI chips is currently about 1 μm, and the number of components per chip is about one million. The years approaching 1990 will see the introduction of submicrometer feature sizes and multimillion-com-ponent chips. As device dimensions and device separations shrink below 1 μm, a new device isolation technique will be required to prevent parasitic coupling between adjacent devices through the Si substrate.
Journal_Title :
Circuits and Devices Magazine, IEEE
DOI :
10.1109/MCD.1987.6323127