• DocumentCode
    1306781
  • Title

    Some properties of thin-film SOI MOSFETs

  • Author

    Colinge, Jean-Pierre

  • Author_Institution
    Hewlett-Packard Labs., Palo Alto, CA, USA
  • Volume
    3
  • Issue
    6
  • fYear
    1987
  • Firstpage
    16
  • Lastpage
    20
  • Abstract
    This paper describes the properties that can be expected from thin-film SOI-MOS transistors. Simple qualitative modeling shows that improvements of different parameters, such as subthreshold slope, hot-electron effects, and short-channel effects, can be obtained when thin, fully depleted films are used.
  • fLanguage
    English
  • Journal_Title
    Circuits and Devices Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    8755-3996
  • Type

    jour

  • DOI
    10.1109/MCD.1987.6323175
  • Filename
    6323175