DocumentCode
1306781
Title
Some properties of thin-film SOI MOSFETs
Author
Colinge, Jean-Pierre
Author_Institution
Hewlett-Packard Labs., Palo Alto, CA, USA
Volume
3
Issue
6
fYear
1987
Firstpage
16
Lastpage
20
Abstract
This paper describes the properties that can be expected from thin-film SOI-MOS transistors. Simple qualitative modeling shows that improvements of different parameters, such as subthreshold slope, hot-electron effects, and short-channel effects, can be obtained when thin, fully depleted films are used.
fLanguage
English
Journal_Title
Circuits and Devices Magazine, IEEE
Publisher
ieee
ISSN
8755-3996
Type
jour
DOI
10.1109/MCD.1987.6323175
Filename
6323175
Link To Document