Title :
Nature Of The Forward Current In Germanium Point Contacts
Author :
Brattain, W.H. ; Bardeen, J.
Keywords :
Conductivity measurement; Contact resistance; Etching; Germanium; Immune system; Rectifiers; Surface resistance; Surface treatment; Testing; Thickness measurement;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/JPROC.1998.658754
