Behavioral Modeling Technique for TID Degradation of Complex Analog Circuits

A behavioral modeling technique has been developed for creating TID-aware behavioral models of voltage feedback op-amps without the creation of an underlying SPICE micro-model. The model accurately predicts the TID response of board-level designs with a 79X increase in simulation speed when compared to the SPICE model for the example application of a Schmitt trigger oscillator. This behavioral model permits the analysis of op amp characteristic sensitivity on circuit level behaviors. This type of sensitivity analysis can be particularly useful for determining which portion of a circuit is most affected by TID and where to more effectively harden a system against TID degradation.