DocumentCode :
1307624
Title :
1997 IEEE Nuclear and Space Radiation Effects Conference (NSREC´97)
Volume :
44
Issue :
6
fYear :
1997
fDate :
12/1/1997 12:00:00 AM
Abstract :
The folowing topics were covered: basic mechanisms of radiation effects; radiation effects in photonic devices and systems; radiation effects in devices and integrated circuits; hardness assurance and testing techniques; dosimetry; isolation technologies; spacecraft environments and effects; single-event mechanisms and charge collection; non-destructive single-event effects in devices; and catastrophic single-event effects
Keywords :
dosimetry; isolation technology; monolithic integrated circuits; optoelectronic devices; radiation effects; radiation hardening (electronics); semiconductor devices; space vehicle electronics; space vehicles; spacecraft charging; testing; catastrophic single-event effects; charge collection; dosimetry; hardness testing techniques; integrated circuits; isolation technologies; monolithic ICs; nondestructive single-event effects; photonic devices; photonic systems; radiation effects; radiation hardness assurance; single-event mechanisms; spacecraft effects; spacecraft environments;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.658943
Filename :
658943
Link To Document :
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