DocumentCode :
1307774
Title :
Total dose testing of a CMOS charged particle spectrometer
Author :
Hancock, B.R. ; Soli, G.A.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume :
44
Issue :
6
fYear :
1997
fDate :
12/1/1997 12:00:00 AM
Firstpage :
1957
Lastpage :
1964
Abstract :
A first-generation CMOS Charged Particle Spectrometer chip was designed at JPL for flight on the STRV-2 spacecraft. These devices will collect electron and proton spectra in low Earth orbit as part of an experiment to demonstrate Active Pixel Sensor (APS) technology in space. This paper presents the results of total dose testing on these chips and, where possible, attempts to extend the results to other Active Pixel Sensors
Keywords :
CMOS integrated circuits; astronomical techniques; cosmic ray apparatus; cosmic ray interactions; electron detection; electron spectrometers; integrated circuit testing; particle spectrometers; proton detection; Active Pixel Sensor; CMOS charged particle spectrometer chip; STRV-2 spacecraft; electron spectra; low Earth orbit; proton spectra; total dose testing; CMOS technology; Circuits; Detectors; Electrons; Protons; Sensor arrays; Space technology; Spectroscopy; Switches; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.658968
Filename :
658968
Link To Document :
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