• DocumentCode
    130791
  • Title

    Similarity assessment of UML class diagrams using simulated annealing

  • Author

    Al-Khiaty, Mojeeb Al-Rhman ; Ahmed, Mariwan

  • Author_Institution
    Inf. & Comput. Sci. Dept., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
  • fYear
    2014
  • fDate
    27-29 June 2014
  • Firstpage
    19
  • Lastpage
    23
  • Abstract
    As model driven development has been promoted to the focus of engineers during the software development, engineers find themselves dealing with a large collection of models. Without managing these models efficiently, the wheel is reinvented over and over, resulting in more duplicated artifacts and an aggravated maintenance effort. Models´ matching is a basic operation for different model management operations such as models´ consolidation and retrieval. It is a kind of a combinatorial problem. The difficulty of the problem comes in two main streams, the similarity assessment and the matching complexity. In this paper, we present the use of Simulated Annealing for matching UML class diagrams based on their lexical, internal, neighborhood similarity, and a combination of them. Additionally the paper empirically compares the accuracy of different similarity metrics in capturing the similarity between two class diagrams within and across domains.
  • Keywords
    Unified Modeling Language; combinatorial mathematics; simulated annealing; software maintenance; software metrics; UML class diagram; combinatorial problem; internal similarity; lexical similarity; matching complexity; model driven development; models matching; neighborhood similarity; similarity assessment; simulated annealing; software development; Accuracy; Computational modeling; Measurement; Object oriented modeling; Semantics; Simulated annealing; Unified modeling language; Simulated Annealing; model matching; reuse; similarity metrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering and Service Science (ICSESS), 2014 5th IEEE International Conference on
  • Conference_Location
    Beijing
  • ISSN
    2327-0586
  • Print_ISBN
    978-1-4799-3278-8
  • Type

    conf

  • DOI
    10.1109/ICSESS.2014.6933505
  • Filename
    6933505