DocumentCode :
1308169
Title :
Investigation of tapered multiple microstrip lines for VLSI circuits
Author :
Mehalic, M.A. ; Mittra, Raj
Volume :
38
Issue :
11
fYear :
1990
fDate :
11/1/1990 12:00:00 AM
Firstpage :
1559
Lastpage :
1567
Abstract :
The analysis of tapered, coupled microstrip transmission lines is presented. These lines, used as interconnects between integrated circuit devices, are modeled using an iteration-perturbation approach applied in the spatial domain. From this model, a frequency-dependent scattering parameter characterization is determined. A time-domain simulation of pulse propagation through the tapered, coupled microstrip lines is performed. The frequency-domain scattering parameters are inverse Fourier transformed to obtain the time-domain Green´s function. The input pulse is convolved with the Green´s function, and a Newton-Raphson algorithm is applied to account for nonlinear loads. Some experimental results are shown, and a simulation approximation is proposed
Keywords :
Green´s function methods; S-parameters; VLSI; digital integrated circuits; iterative methods; perturbation techniques; strip line components; strip lines; time-domain analysis; Newton-Raphson algorithm; VLSI circuits; frequency-dependent scattering parameter characterization; frequency-domain scattering parameters; high-speed digital circuits; integrated circuit devices; interconnects; inverse Fourier transformed; iteration-perturbation approach; nonlinear loads; pulse propagation; spatial domain; tapered multiple microstrip lines; time-domain Green´s function; time-domain simulation; Coupling circuits; Distributed parameter circuits; Frequency; Green´s function methods; Integrated circuit interconnections; Integrated circuit modeling; Microstrip; Scattering parameters; Time domain analysis; Very large scale integration;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.60000
Filename :
60000
Link To Document :
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