DocumentCode :
1308258
Title :
A 3.3-V single-poly CMOS audio ADC delta-sigma modulator with 98-dB peak SINAD and 105-dB peak SFDR
Author :
Fogelman, E. ; Galton, Ian ; Huff, William ; Jensen, Henrik
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
Volume :
35
Issue :
3
fYear :
2000
fDate :
3/1/2000 12:00:00 AM
Firstpage :
297
Lastpage :
307
Abstract :
This paper presents a second-order /spl Delta//spl Sigma/ modulator for audio-band analog-to-digital conversion implemented in a 3.3-V, 0.5-/spl mu/m, single-poly CMOS process using metal-metal capacitors that achieves 98-dB peak signal-to-noise-and-distortion ratio and 105-dB peak spurious-free dynamic range. The design uses a low-complexity, first-order mismatch shaping 33-level digital-to-analog converter and a 33-level flash analog-to-digital converter with digital common-mode rejection and dynamic element matching of comparator offsets. These signal-processing innovations, combined with established circuit techniques, enable state-of-the art performance in CMOS technology optimized for digital circuits.
Keywords :
CMOS integrated circuits; analogue-digital conversion; audio signal processing; delta-sigma modulation; mixed analogue-digital integrated circuits; modulators; switched capacitor networks; 0.5 micron; 3.3 V; audio ADC delta-sigma modulator; audio-band A/D conversion; comparator offsets; digital common-mode rejection; dynamic element matching; first-order mismatch shaping DAC; flash ADC; metal-metal capacitors; second-order /spl Delta//spl Sigma/ modulator; signal processing; single-poly CMOS process; Analog-digital conversion; CMOS process; CMOS technology; Capacitors; Circuits; Delta modulation; Digital-analog conversion; Dynamic range; Signal processing; Technological innovation;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.826811
Filename :
826811
Link To Document :
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