DocumentCode :
1308287
Title :
Concurrent simulation of nearly identical digital networks
Author :
Ulrich, E.G. ; Baker, T.
Author_Institution :
GTE Laboratories Inc.
Volume :
7
Issue :
4
fYear :
1974
fDate :
4/1/1974 12:00:00 AM
Firstpage :
39
Lastpage :
44
Abstract :
Test patterns for testing digital circuits are usually checked on a test verification program to determine if all or most of the possible faults will be detected. Historically, such a test verification program would be accomplished with many simulations: one for each possible fault.
fLanguage :
English
Journal_Title :
Computer
Publisher :
ieee
ISSN :
0018-9162
Type :
jour
DOI :
10.1109/MC.1974.6323496
Filename :
6323496
Link To Document :
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