• DocumentCode
    1308287
  • Title

    Concurrent simulation of nearly identical digital networks

  • Author

    Ulrich, E.G. ; Baker, T.

  • Author_Institution
    GTE Laboratories Inc.
  • Volume
    7
  • Issue
    4
  • fYear
    1974
  • fDate
    4/1/1974 12:00:00 AM
  • Firstpage
    39
  • Lastpage
    44
  • Abstract
    Test patterns for testing digital circuits are usually checked on a test verification program to determine if all or most of the possible faults will be detected. Historically, such a test verification program would be accomplished with many simulations: one for each possible fault.
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.1974.6323496
  • Filename
    6323496