DocumentCode
1308287
Title
Concurrent simulation of nearly identical digital networks
Author
Ulrich, E.G. ; Baker, T.
Author_Institution
GTE Laboratories Inc.
Volume
7
Issue
4
fYear
1974
fDate
4/1/1974 12:00:00 AM
Firstpage
39
Lastpage
44
Abstract
Test patterns for testing digital circuits are usually checked on a test verification program to determine if all or most of the possible faults will be detected. Historically, such a test verification program would be accomplished with many simulations: one for each possible fault.
fLanguage
English
Journal_Title
Computer
Publisher
ieee
ISSN
0018-9162
Type
jour
DOI
10.1109/MC.1974.6323496
Filename
6323496
Link To Document