DocumentCode
1308365
Title
The role of thermal and fission neutrons in reactor neutron-induced upsets in commercial SRAMs
Author
Griffin, Patrick J. ; Luera, T.E. ; Sexton, E.W. ; Cooper, P.J. ; Karr, S.G. ; Hash, G.L. ; Fuller, E.
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
Volume
44
Issue
6
fYear
1997
fDate
12/1/1997 12:00:00 AM
Firstpage
2079
Lastpage
2086
Abstract
Reactor neutron environments can be used to test/screen the sensitivity of unhardened commercial SRAMs to low-LET neutron-induced upset. Tests indicate both thermal/epithermal (<1 keV) and fast neutrons can cause upsets in unhardened parts. Measured upset rates in reactor environments can be used to estimate the upset rates from thermal and fast portions of arbitrary neutron spectra
Keywords
SRAM chips; integrated circuit testing; neutron effects; commercial SRAMs; fission neutrons; reactor neutron environments; reactor neutron-induced upsets; sensitivity screening; sensitivity testing; thermal neutrons; unhardened static RAM; Atmosphere; Atomic measurements; Inductors; Laboratories; Neutrons; Random access memory; Silicon; Single event upset; Tail; Testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.659019
Filename
659019
Link To Document