Title :
The role of thermal and fission neutrons in reactor neutron-induced upsets in commercial SRAMs
Author :
Griffin, Patrick J. ; Luera, T.E. ; Sexton, E.W. ; Cooper, P.J. ; Karr, S.G. ; Hash, G.L. ; Fuller, E.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fDate :
12/1/1997 12:00:00 AM
Abstract :
Reactor neutron environments can be used to test/screen the sensitivity of unhardened commercial SRAMs to low-LET neutron-induced upset. Tests indicate both thermal/epithermal (<1 keV) and fast neutrons can cause upsets in unhardened parts. Measured upset rates in reactor environments can be used to estimate the upset rates from thermal and fast portions of arbitrary neutron spectra
Keywords :
SRAM chips; integrated circuit testing; neutron effects; commercial SRAMs; fission neutrons; reactor neutron environments; reactor neutron-induced upsets; sensitivity screening; sensitivity testing; thermal neutrons; unhardened static RAM; Atmosphere; Atomic measurements; Inductors; Laboratories; Neutrons; Random access memory; Silicon; Single event upset; Tail; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
