Title :
Burn-in economics model for multi-chip modules
Author :
Alani, A. ; Dislis, C. ; Jalowiecki, I.
Author_Institution :
LSI Logic Eur., Bracknell, UK
fDate :
12/5/1996 12:00:00 AM
Abstract :
Burn-in is an essential part of semiconductor product screening to significantly reduce or eliminate defective parts, hence improving product reliability. However, the cost implications of burn-in on some products may be prohibitively expensive. The economics model of burn-in presented here helps predict the cost and quality implications of this process for multi-chip modules
Keywords :
economics; integrated circuit reliability; integrated circuit testing; multichip modules; burn-in economics model; cost; multi-chip module; quality; reliability; semiconductor product screening;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19961559