Title :
Scattering parameters of E-plane printed opposite fin in waveguide
Author :
Ho, T.Q. ; Shih, Y.C.
Author_Institution :
Hughes Aircraft Co., Los Angeles, CA, USA
fDate :
11/1/1990 12:00:00 AM
Abstract :
An analysis of the E-plane printed opposite fin in a waveguide is presented. The current distribution existing on the metal fin is obtained through a variational technique that utilizes the extremization process. The eigenvalue functions derived from the transverse resonance condition are used to include the effects of the dielectric layer. The computed data for a simplified case with Duroid substrate are compared with those obtained by means of the spectral-domain method. Based on the calculated results, a band-reject filter has been designed and tested at Ka-band. Good agreement on the filter response has been observed between theory and measurement
Keywords :
S-parameters; current distribution; eigenvalues and eigenfunctions; microwave filters; variational techniques; waveguide components; Duroid substrate; E-plane; Ka-band; band-reject filter; current distribution; dielectric layer; eigenvalue functions; extremization process; filter response; metal fin; printed opposite fin; spectral-domain method; transverse resonance condition; variational technique; waveguide; Circuits; Current distribution; Dielectrics; Diodes; Eigenvalues and eigenfunctions; Filters; Impedance; Planar waveguides; Scattering parameters; Strips;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
