• DocumentCode
    1308448
  • Title

    A simplified broad-band large-signal nonquasi-static table-based FET model

  • Author

    Fernández-Barciela, Mónica ; Tasker, Paul J. ; Campos-Roca, Yolanda ; Demmler, Markus ; Massler, Hermann ; Sánchez, Enrique ; Currás-Francos, M. Carmen ; Schlechtweg, Michael

  • Author_Institution
    Dept. of Tecnologias de las Communicaciones, Univ. of Vigo, Spain
  • Volume
    48
  • Issue
    3
  • fYear
    2000
  • fDate
    3/1/2000 12:00:00 AM
  • Firstpage
    395
  • Lastpage
    405
  • Abstract
    In this paper, a simplified nonquasi-static table-based approach is developed for high-frequency broad-band large-signal field-effect-transistor modeling. As well as low-frequency dispersion, the quadratic frequency dependency of the γ-parameters at high frequencies is taken into account through the use of linear delays. This model is suitable for applications related to nonlinear microwave computer-aided design and can be both easily extracted from dc and S-parameter measurements and implemented in commercially available simulation tools. Model formulation, small-signal, and large-signal validation will be described in this paper. Excellent results are obtained from dc up to the device fT frequencies, even when f T is as high as 100 GHz
  • Keywords
    S-parameters; circuit CAD; delays; microwave field effect transistors; semiconductor device models; γ-parameters; S-parameter measurements; field-effect-transistor modeling; high-frequency broad-band large-signal field-effect-transistor; large-signal validation; linear delays; low-frequency dispersion; microwave computer-aided design; nonquasi-static table-based FET model; quadratic frequency dependency; simulation tools; Associate members; Bandwidth; Data mining; Design automation; FETs; Microwave devices; Millimeter wave circuits; Millimeter wave measurements; Millimeter wave technology; Radio frequency;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.826838
  • Filename
    826838