DocumentCode :
1308488
Title :
A large-signal switching MESFET model for intermodulation distortion analysis
Author :
Fujii, Kohei ; Hara, Yasuhiko ; Yakabe, Toshiyuki ; Yabe, Hatsuo
Author_Institution :
Japan Radio Co. Ltd., Tokyo, Japan
Volume :
48
Issue :
3
fYear :
2000
fDate :
3/1/2000 12:00:00 AM
Firstpage :
431
Lastpage :
436
Abstract :
This paper describes an improved large-signal model for predicting an intermodulation distortion (IMD) power characteristic of MESFETs in switching applications. The model is capable of modeling the voltage-dependent drain current and its derivatives, including gate-source and gate-drain capacitors. The drain current and its derivatives are described by a function of a voltage-dependent drain conductance. The model parameters are extracted from a measured drain conductance versus gate voltage characteristic of a MESFET. This paper also presents a new fully symmetric equivalent circuit for switching MESFETs. The IMD power characteristics calculated with the use of the proposed method are compared with experimental data taken from a monolithic microwave integrated circuit single-pole double-throw switch. Good agreements over the large gate voltages and input power levels are observed
Keywords :
Schottky gate field effect transistors; equivalent circuits; field effect transistor switches; intermodulation distortion; microwave field effect transistors; microwave switches; semiconductor device models; IMD analysis; IMD power characteristic prediction; SPDT MMIC switch; gate-drain capacitors; gate-source capacitors; intermodulation distortion analysis; large-signal switching MESFET model; model parameters extraction; single-pole double-throw switch; switching applications; symmetric equivalent circuit; voltage-dependent drain conductance; voltage-dependent drain current; Capacitors; Data mining; Distortion measurement; Integrated circuit measurements; Intermodulation distortion; MESFETs; Predictive models; Switches; Switching circuits; Voltage;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.826843
Filename :
826843
Link To Document :
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