DocumentCode
1308524
Title
An efficient characterization of interconnected multiconductor-transmisslon-line networks
Author
Orlandi, A. ; Paul, C.R.
Author_Institution
Dept. of Electr. Eng., Univ. of l´´Aquila, Italy
Volume
48
Issue
3
fYear
2000
fDate
3/1/2000 12:00:00 AM
Firstpage
466
Lastpage
470
Abstract
The numerical solution of the multiconductor-transmission-line (MTL) equations for lossy interconnected transmission lines (TLs) is investigated in this paper. The solution for the transmission line segments is accomplished through the finite-difference time-domain method, whereas the terminations and interconnection networks (which may contain nonlinearities) are characterized with an efficient state-variable representation. High-frequency skin-effect losses in the TLs are included in the MTL equations through convolution integrals in the MTL equations. The computation of these convolution integrals represents the bulk of the solution effort. Two methods, the singular-value-decomposition method and the matrix-pencil method, are shown to significantly reduce the computation time and improve the solution accuracy
Keywords
convolution; distributed parameter networks; finite difference time-domain analysis; linear network analysis; losses; matrix algebra; multiconductor transmission lines; singular value decomposition; skin effect; transmission line theory; FDTD method; HF skin-effect losses; SVD method; characterization; computation time; convolution integrals; finite-difference time-domain method; interconnected multiconductor-transmission-line networks; interconnection networks; lossy interconnected transmission lines; matrix-pencil method; singular-value-decomposition method; state-variable representation; terminations; transmission line segments; Computer networks; Conductors; Convolution; Finite difference methods; Frequency; Integral equations; Integrated circuit interconnections; Multiprocessor interconnection networks; Nonlinear equations; Time domain analysis;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.826849
Filename
826849
Link To Document