Title :
Optimized single-layer antireflection coatings for semiconductor lasers
Author :
Gallant, D.J. ; Tilton, M.L. ; Bossert, D.J. ; Barrie, J.D. ; Dente, G.C.
Author_Institution :
Rockwell Power Syst., Kirtland AFB, NM, USA
fDate :
3/1/1997 12:00:00 AM
Abstract :
We describe a method for determining the optimum coating parameters for a single-layer antireflection (AR) facet coating design. Single-layer AR coatings were deposited on broad-area single-quantum-well semiconductor lasers. Experimental and theoretical results indicate power reflectivities on the order of 5/spl times/10/sup -6/.
Keywords :
antireflection coatings; laser theory; optical films; optimisation; quantum well lasers; reflectivity; broad-area single-quantum-well semiconductor lasers; optimum coating parameters; power reflectivities; semiconductor lasers; single layer antireflection facet coating design; single-layer antireflection coating optimisation; Coatings; Impedance; Laser theory; Optical reflection; Optical waveguides; Planar waveguides; Power amplifiers; Reflectivity; Semiconductor lasers; Semiconductor optical amplifiers;
Journal_Title :
Photonics Technology Letters, IEEE
