DocumentCode :
1309156
Title :
Predictions and observations of SEU rates in space
Author :
Petersen, E.L.
Author_Institution :
9502 Babson Ct., Fairfax, VA, USA
Volume :
44
Issue :
6
fYear :
1997
fDate :
12/1/1997 12:00:00 AM
Firstpage :
2174
Lastpage :
2187
Abstract :
This paper summarizes the available data on the observation and prediction of SEU rates in space. It considers three questions: 1. How good can a prediction be? 2. How bad can a prediction be? 3. How does the quality of the prediction depend on the type of orbit? The paper considers one hundred and twenty-six reports of predicted and observed rates. These include updated predictions for the CRRES devices. The analysis then excludes solar particle events, single event burnout, cases with poor statistics, and cases that are essentially duplicates; leaving 77 comparisons. The heavy ion predictions based on the CREME environments and the proton predictions based on the AP8 environments are both very successful for their basic environments, but are less accurate for low earth orbits (LEO). The quality of the results depends strongly on whether the predictions are based on tests with flight parts or with generic parts. The quality also depends on the use of the proper shielding around the part. The results appear consistent with suggested modifications in these environments based on recent space measurements. The methods that are used for upset rate predictions appear to be adequate for the current generation of devices
Keywords :
ion beam effects; proton effects; space vehicle electronics; AP8 environment; CREME environment; CRRES device; SEU rate; heavy ion irradiation; low earth orbit; proton irradiation; shielding; single event burnout; solar particle event; space; statistics; Extraterrestrial measurements; Low earth orbit satellites; Orbital calculations; Packaging; Protons; Radiation effects; Single event upset; Statistical analysis; Testing; Uncertainty;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.659033
Filename :
659033
Link To Document :
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